Gaya APA

Stein, B, V. et al (2023). Article - Deep-BIAS: Detecting Structural Bias using Explainable AI Vol: - (Issue): - Hal: 455–458 (Vol: - (Issue): - Hal: 455–458). : Association for Computing Machinery (ACM), New York, NY, USA.

Gaya MLA

Stein, Bas, Van. et al. "Article - Deep-BIAS: Detecting Structural Bias using Explainable AI Vol: - (Issue): - Hal: 455–458". Vol: - (Issue): - Hal: 455–458 : Association for Computing Machinery (ACM), New York, NY, USA, 2023. Electronic Resource.